| ISBN |
9780123742209
012374220X
|
| 청구기호 |
621.367 H392a |
| 형태사항 |
xv, 538 p., [32] p. of plates : ill. (some col.) ; 24 cm.
|
| 언어 |
English |
| 서지주기 |
Includes bibliographical references and index.
|
| 내용 |
History of direct aberration correction / Harald Rose -- Present and future hexapole aberration correctors for high-resolution electron microscopy / Maximilian Haider, Heiko Muller, and Stephan Uhlemann -- Advances in aberration-corrected scanning transmission electron microscopy and electron energy-loss spectroscopy / Ondrej L. Krivanek ... [et al.] -- First results using the Nion third-order scanning transmission electron microscope corrector / P.E. Batson -- Scanning transmission electron microscopy and electron energy loss spectroscopy / Andrew L. Bleloch -- Aberration correction with the SACTEM-Toulouse / Florent Houdellier ... [et al.] -- Novel aberration corrrection concepts / Bernd Kabius and Harald Rose -- Aberration-corrected imaging in conventional transmission electron microscopy and scanning transmission electron microscopy / Angus I. Kirkland ... [et al.] -- Materials applications of aberration-corrected scanning transmission electron microscopy / S.J. Pennycook ... [et al.] -- Spherical aberration-corrected transmission electron microscopy for nanomaterials / Nobuo Tanaka -- Atomic-resolution aberration-corrected transmission electron microscopy / Knut Urban ... [et al.] -- Aberration-corrected electron microscopes at Brookhaven National Laboratory / Yimei Zhu and Joe Wall.
|
| 주제 |
Transmission electron microscopy.
Scanning transmission electron microscopy.
Aberration.
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| QR CODE |
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